Patent · US Active

Characterizing electronic component parameters including on-chip variations and moments

US10789406B1 · kind B1 · utility

5Cited by
15References
18Claims
0Family size

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Key dates

Filing dateNov 16, 2018
Grant dateSep 29, 2020
Priority date
Expiry dateDec 4, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present embodiments are generally directed to electronic circuit design and verification and more particularly to techniques for characterizing electronic components within an electronic circuit design for use in verification. In one or more embodiments, an adaptive sensitivity based analysis is used to build an adaptive equation to represent the timing response surface for an electronic component. With the adaptive surface response built, a sample-based evaluation yields highly accurate extraction of electronic component timing parameters including on-chip variation information such as sigma and moments.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.