Integrated circuit contact test apparatus with and method of construction
US10794933B1 · kind B1 · utility
2Cited by
21References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2017 |
| Grant date | Oct 6, 2020 |
| Priority date | — |
| Expiry date | Apr 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R3/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test socket for a device under test (DUT) is disclosed in several embodiments. One embodiment shows a test socket base (16) with apertures (30) for insertion of test pin insert blocks (28). The blocks are inserted top—in or bottom—in and are provided with registration bosses 80 and teeth 92 or other means for maintaining registration. Blocks are provided with dielectric constants to achieve different frequency response relative to other pins. To achieve great EMI and cross talk isolation, the socket may be made of aluminum with hard anodize coating to insulate test pins (32) from the housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.