Method for programming a resistive random access memory
US10803940B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 2019 |
| Grant date | Oct 13, 2020 |
| Priority date | — |
| Expiry date | May 10, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2013/0092
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for programming a resistive random access memory including a matrix of memory cells. This method includes a programming procedure that includes applying a programming voltage ramp to the memory cells of a part at least of the matrix, the programming voltage ramp starting at a first non-zero voltage value, called start voltage, and ending at a second voltage value, called stop voltage, greater in absolute value than the first voltage value. The stop voltage is determined such that each memory cell of said at least one part of the matrix has a first probability between 1/(10N) and 1/N of having a programming voltage greater in absolute value than the stop voltage (Vstop), N being the number of memory cells in the at least one part of the matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.