Methods and apparatus for detecting an interferent in a specimen

US10816538B2 · kind B2 · utility

Assignee

• Siemens Healthcare Diagnostics Inc. · US

Inventors

• Stefan Kluckner · Berlin, DE
• Yao-Jen Chang
• Terrence Chen · Princeton, US
• Benjamin S. Pollack · Budd Lake, US
• Patrick Wissmann · Munich, DE

Key dates

• Filing date: Jan 24, 2017
• Grant date: Oct 27, 2020
• Expiry date: Jan 31, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/20081
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A model-based method of inspecting a specimen for presence of an interferent (H, I, and/or L). The method includes capturing images of the specimen at multiple different exposures times and at multiple spectra having different nominal wavelengths, selection of optimally-exposed pixels from the captured images to generate optimally-exposed image data for each spectra, identifying a serum or plasma portion of the specimen, and classifying whether an interferent is present or absent within the serum or plasma portion. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.