Inventor · Munich, DE

Patrick Wissmann

10Patents
3h-index
14Co-inventors
49Inventor score

Filing activity: Jan 13, 2014 → Oct 22, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US10816538B2 Methods and apparatus for detecting an interferent in a specimen Physics 13 Active
US10928310B2 Methods and apparatus for imaging a specimen container and/or specimen using multiple exposures Physics 7 Active
US10725060B2 Image-based tray alignment and tube slot localization in a vision system Physics 3 Active
US11073472B2 Methods and apparatus for characterizing a specimen using pattern illumination Physics 2 Active
US11538159B2 Methods and apparatus for label compensation during specimen characterization Physics 1 Active
US9778359B2 Method and system for the hand-guided ultrasound check of a test object Physics 0 Active
US11815519B2 Stray light compensating methods and apparatus for characterizing a specimen Physics 0 Active
US12253533B2 Methods and apparatus providing calibration of background illumination for sample and/or sample container characterization Physics 0 Active
US11815446B2 Methods and apparatus for characterizing a specimen container and specimen Physics 0 Active
US11333553B2 Methods and apparatus for specimen characterization using hyperspectral imaging Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.