Patent · US Active

RF impedance measurement and tuning system

US10816581B2 · kind B2 · utility

0Cited by

34References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Valentyn Solomko · Munich, DE
Ruediger Bauder · Feldkirchen-Westerham, DE
Anthony Thomas · Munich, DE

Key dates

Filing date	Sep 17, 2018
Grant date	Oct 27, 2020
Priority date	—
Expiry date	Feb 5, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04B1/3833
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A radio-frequency system includes an impedance tuning network having a plurality of selectable impedance states and a first port for coupling to a complex load impedance, a detector coupled to a second port of the impedance tuning network and configured to measure scalar values of reflection coefficients at the second port, and a controller configured to, for a first radio-frequency band, sequentially tune the impedance tuning network to at least three different impedance states in each of which the detector measures a scalar value of a corresponding reflection coefficient at the second port, and estimates a value of the complex load impedance based on the scalar values measured by the detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.