Health monitoring for capacitor array in storage devices
US10818370B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2019 |
| Grant date | Oct 27, 2020 |
| Priority date | — |
| Expiry date | Sep 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques related to monitoring a health of a capacitor array of an SSD are described. In an example, a direct leakage current check is performed by determining voltages of the capacitor array at different times, computing a resistance of the capacitor array based on the voltages, and generating health data for the capacitor array based on the resistance. In another example, an indirect leakage current check is performed by determining at least one of: a number of times a voltage maintaining process is performed within a predefined time duration or a time difference between repeating the voltage maintaining process, comparing the at least one of the number of times or the time difference and a threshold, and generating the health data based on the comparison of the at least one of the number of times or the time difference and the threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.