System and method for imaging a surface defect on an object
US10823681B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2017 |
| Grant date | Nov 3, 2020 |
| Priority date | — |
| Expiry date | Jul 19, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and a method for imaging a surface defect on an object are provided. The system includes an actuator, a sensor assembly connected to the actuator, and a processor configured to control the actuator and the sensor assembly. The sensor assembly includes at least one sensor configured to capture at least one image of the object. The processor is configured to control the actuator and the sensor assembly to identify the actuator and the sensor assembly, a region of a region of interest associated with the surface defect using an using an image of the object and to repeatedly identify at least one subsequent region of interest associated with the surface defect using at least a preceding region of interest such that the surface defect is identified according to a predetermined criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.