Jierong CHENG
3Patents
0h-index
7Co-inventors
24Inventor score
Filing activity: Mar 30, 2017 → Dec 8, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12260538B2 | Defect detection in image space | Physics | 0 | Active |
| US10823681B2 | System and method for imaging a surface defect on an object | Physics | 0 | Active |
| US11670078B2 | Method and system for visual based inspection of rotating objects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.