Systems and methods for gated-insulator reconfigurable non-volatile memory devices
US10854812B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Dec 24, 2019 |
| Grant date | Dec 1, 2020 |
| Priority date | — |
| Expiry date | Dec 24, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2213/77
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods of use and fabrication are described for a non-volatile resistive random access memory (RRAM) multi-terminal device including a first electrode, a second electrode, a metal oxide disposed between the first electrode and the second electrode, and an at least first gate configured to apply a voltage bias to change a resistive state in the metal oxide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.