Method for reflection correction of images and devices in this regard

US10866401B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Lars Stoppe · Jena, DE
• Thomas MILDE · Nausnitz, DE
• Johannes Winterot · Jena, DE

Key dates

• Filing date: Apr 29, 2016
• Grant date: Dec 15, 2020
• Expiry date: Jun 29, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/20224
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

The invention relates to a reflection correction method for correcting digital microscopic images. Here, the reflection correction method comprises: illuminating an object, the illuminating of the object having at least two illumination patterns. Creating an illumination pattern image of the object for each illumination pattern. Calculating at least one partial reflection image, in each case by means of a combination of corresponding two illumination pattern images. Calculating a reflection-corrected image of the object by means of a suitable combination of at least one illumination pattern image and at least one partial reflection image. And, in this case, each illumination pattern as at least one active illumination source, and each illumination pattern is different from all others. Furthermore, the invention relates to an associated reflection-correcting device.