Patent · US Active

In-system structural testing of a system-on-chip (SoC) using a peripheral interface port

US10877088B2 · kind B2 · utility

0Cited by

0References

17Claims

0Family size

Assignee

QUALCOMM Incorporated · US

Inventors

Punit Kishore · Bengaluru, IN
Tomer Rafael Ben-Chen · Foster City, US
Sharon Graif · Petah Tikva, IL

Key dates

Filing date	Jan 30, 2019
Grant date	Dec 29, 2020
Priority date	—
Expiry date	Jan 30, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06F2213/0042
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of in-system structural testing of a system-on-chip (SoC) using a peripheral interface port is described. The method including enabling a scan interface controller of the SoC through the peripheral interface port. The method also includes streaming structural test patterns in the SoC through the scan interface controller.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.