Methods and apparatus for testing multiple fields for machine vision
US10878299B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2018 |
| Grant date | Dec 29, 2020 |
| Priority date | — |
| Expiry date | Mar 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a three-dimensional model. A three-dimensional model is stored, the three dimensional model comprising a set of probes. Three-dimensional data of an object is received, the three-dimensional data comprising a set of data entries. The three-dimensional data is converted into a set of fields, comprising generating a first field comprising a first set of values, where each value of the first set of values is indicative of a first characteristic of an associated one or more data entries from the set of data entries, and generating a second field comprising a second set of values, where each second value of the second set of values is indicative of a second characteristic of an associated one or more data entries from the set of data entries, wherein the second characteristic is different than the first characteristic. A pose of the three-dimensional model is tested with the set of fields, comprising testing the set of probes to the set of fields, to determine a score for the pose.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.