System and method of monitoring a switching transistor

US10895601B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Matthias Bogus · Munich, DE
• Jens Barrenscheen · Munich, DE
• Christian Heiling · Graz, AT
• Benno Koeppl · Markt Indersdorf, DE
• Markus Zannoth · Munich, DE

Key dates

• Filing date: May 10, 2019
• Grant date: Jan 19, 2021
• Expiry date: May 10, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/54
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In accordance with an embodiment, a method includes using a monitoring circuit disposed on a monolithic integrated circuit to monitor an output signal of a first switching transistor for a first output edge transition at a monitoring terminal of the monolithic integrated circuit; using a time measuring circuit disposed on the monolithic integrated circuit to measure a first time delay between a first input edge transition of a first drive signal and the first output edge transition, where the first drive signal is configured to cause a change of state of the first switching transistor; using an analysis circuit disposed on the monolithic integrated circuit to compare the measured first time delay with a first predetermined threshold to form a first comparison result; and indicating a first error condition based on the first comparison result.