Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy

US10914933B2 · kind B2 · utility

Assignee

• The United States of America, as represented by the Secretary, Department of Health and Human Services · US

Inventors

• Hari Shroff · Rockville, US
• Justin Taraska · Bethesda, US
• John Giannini · Bethesda, US
• Yicong Wu · North Potomac, US
• Abhishek Kumar · Bengaluru, IN
• Min Guo · Fremont, US

Key dates

• Filing date: Sep 4, 2019
• Grant date: Feb 9, 2021
• Expiry date: Sep 4, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/0048
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.