Method and device for measuring distortion parameter of visual reality device, and measuring system
US10922795B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 27, 2018 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Dec 16, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2027/011
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method measuring a distortion parameter of a visual reality device includes: obtaining an anti-distortion grid image according to a first distortion coefficient; obtaining a grid image of the anti-distortion grid image at a preset viewpoint after the anti-distortion grid image passes through a to-be-measured optical component of the visual reality device; determining a distortion type of the grid image after passing through the to-be-measured optical component; adjusting the first distortion coefficient according to the distortion type of the grid image, thereby obtaining an adjusted first distortion coefficient and then reducing distortion of the grid image; repeating the above steps until the distortion of the grid image is less than or equal to a distortion threshold. The adjusted first distortion coefficient when the distortion of the grid image is less than or equal to the distortion threshold, is taken as a distortion coefficient of the to-be-measured optical component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.