Image evaluation method and image evaluation device
US10937146B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2019 |
| Grant date | Mar 2, 2021 |
| Priority date | — |
| Expiry date | May 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The image evaluation device includes a design data image generation unit that images design data; a machine learning unit that creates a model for generating a design data image from an inspection target image, using the design data image as a teacher and using the inspection target image corresponding to the design data image; a design data prediction image generation unit that predicts the design data image from the inspection target image, using the model created by the machine learning unit; a design data image generation unit that images the design data corresponding to the inspection target image; and a comparison unit that compares a design data prediction image generated by the design data prediction image generation unit and the design data image. As a result, it is possible to detect a systematic defect without using a defect image and generating misinformation frequently.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.