Single diffusion break device for FDSOI
US10957578B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Sep 28, 2018 |
| Grant date | Mar 23, 2021 |
| Priority date | — |
| Expiry date | Sep 28, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/31144
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to semiconductor structures and, more particularly, to a single diffusion break device and methods of manufacture. The structure includes a single diffusion break structure with a fill material between sidewall spacers of the single diffusion break structure and a channel oxidation below the fill material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.