Device and method for measuring in-situ time-resolved X-ray absorption spectrum

US10969348B2 · kind B2 · utility

Assignee

• Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences · CN

Inventors

• Jianda Shao · Shanghai, CN
• Shijie Liu · Shanghai, CN
• Shenghao Wang · Shanghai, CN

Key dates

• Filing date: Sep 12, 2019
• Grant date: Apr 6, 2021
• Expiry date: Oct 11, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/502
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Device and method for measuring in-situ time-resolved X-ray absorption spectrum. The device comprises an X-ray source, a first slit, an acousto-optic tunable X-ray filter, a radio frequency transmitter, a second slit, a front ionization chamber, a front ionization chamber signal amplifier, a sample to be tested, a rear ionization chamber, a rear ionization chamber signal amplifier, a data collector, and a computer. The X-ray source, the acousto-optic tunable X-ray filter, and the radio frequency transmitter are used to generate a monochromatic X-ray beam; the front ionization chamber is used to measure the intensity of the X-ray beam before passing through the sample; the rear ionization chamber is used to measure the intensity of the X-ray beam after passing through the sample; the front ionization chamber signal amplifier, the rear ionization chamber signal amplifier, the data collector, and the computer are used for data acquisition and data processing.