Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
61Patents
61Active
61Granted
56Portfolio score
Filing activity: Nov 23, 2006 → Mar 23, 2023 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7739962B2 | Optical tables | Emerging Cross-Sectional Technologies | 5 | Active |
| US9116259B2 | Three dimensional angular adjustable optical mount | Physics | 3 | Active |
| US11029611B2 | Device and method for detecting projection objective wave-front aberration | Physics | 2 | Active |
| US9709730B2 | Hollow-core photonic crystal fiber gas cell and method for preparing the same | Physics | 2 | Active |
| US9766154B2 | Multi field point aberration parallel metrology device and method for lithographic projection lens | Physics | 2 | Active |
| US9297744B2 | Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution in real time | Physics | 2 | Active |
| US11009336B2 | Method for wavefront measurement of optical imaging system based on grating shearing interferometry | Physics | 2 | Active |
| US10136078B2 | Random grating based compressive sensing wideband hyperspectral imaging system | Physics | 2 | Active |
| US9121788B2 | Device and method for detecting optical performance of beam shaping element | Physics | 1 | Active |
| US9658114B1 | Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration | Physics | 1 | Active |
| US11098416B2 | Doped gallium oxide crystalline material and preparation method and application thereof | Chemistry; Metallurgy | 1 | Active |
| US10969274B2 | Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer | Physics | 1 | Active |
| US9488525B2 | Method and apparatus for femtosecond laser pulse measurement based on transient-grating effect | Physics | 1 | Active |
| US11215512B2 | Light intensity fluctuation-insensitive projection objective wave aberration detection device and detection method thereof | Physics | 1 | Active |
| US9863841B2 | Measuring device having ideal wavefront generator for detecting point diffraction interferometric wavefront aberration of measured optical system and method for detecting wavefront aberration thereof | Physics | 0 | Active |
| US9036154B2 | Four-axis four-subdividing interferometer | Physics | 0 | Active |
| US12224546B2 | Ultrastable laser system based on polarization-maintaining optical fiber | Electricity | 0 | Active |
| US11604418B2 | Multi-channel device and method for measuring distortion and magnification of objective lens | Physics | 0 | Active |
| US12007259B2 | Multi-dimensional spatial positioning system and method for disturbance source | Physics | 0 | Active |
| US12099238B2 | Device and method for splicing array optical fiber with large-size quartz end cap | Physics | 0 | Active |
| US9559411B2 | Method for producing infrared ZnS domes | Chemistry; Metallurgy | 0 | Active |
| US11888282B2 | Laser driving device and method for enabling uniform light field | Electricity | 0 | Active |
| US11227632B2 | Radial servo device for super-resolution optical disc and servo control method therefor | Physics | 0 | Active |
| US10969348B2 | Device and method for measuring in-situ time-resolved X-ray absorption spectrum | Physics | 0 | Active |
| US11175220B2 | Surface defect measuring apparatus and method by microscopic scattering polarization imaging | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.