System and method for performing scanning tunneling microscopy on current-carrying samples
US10976344B1 · kind B1 · utility
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Key dates
| Filing date | Dec 6, 2019 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Dec 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1284
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning tunneling microscopy based potentiometry system and method for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry system and method is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry system and method to the local sensing of the spin Hall effect is outlined herein, along with the experimental results obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.