Method for producing a stress-decoupled micromechanical pressure sensor
US10988377B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2017 |
| Grant date | Apr 27, 2021 |
| Priority date | — |
| Expiry date | May 2, 2038 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB81C2203/035
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for producing a micromechanical pressure sensor. The method includes: providing a MEMS wafer having a silicon substrate and a first cavity developed therein underneath a sensor diaphragm; providing a second wafer; bonding the MEMS wafer to the second wafer; and exposing a sensor core from the rear side; a second cavity being formed in the process between the sensor core and the surface of the silicon substrate, and the second cavity being developed with the aid of an etching process which is carried out using etching parameters that are modified in a defined manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.