Torsten Kramer
15Patents
3h-index
36Co-inventors
60Inventor score
Filing activity: Oct 6, 2000 → Jun 24, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8470631B2 | Method for manufacturing capped MEMS components | Electricity | 9 | Active |
| US9926188B2 | Sensor unit including a decoupling structure and manufacturing method therefor | Electricity | 7 | Active |
| US7989263B2 | Method for manufacturing a micromechanical chip and a component having a chip of this type | Performing Operations; Transporting | 3 | Active |
| US8530261B2 | Method for producing a component, and sensor element | Performing Operations; Transporting | 1 | Active |
| US6655599B2 | Data carrier having reset means for interrupting the processing | Physics | 1 | Expired |
| US6827278B1 | Data carrier | Physics | 1 | Expired |
| US10988377B2 | Method for producing a stress-decoupled micromechanical pressure sensor | Performing Operations; Transporting | 0 | Active |
| US10473683B2 | Sensor element for thermal anemometry | Performing Operations; Transporting | 0 | Active |
| US12145808B2 | Method and device for handling (hygiene) products | Performing Operations; Transporting | 0 | Active |
| US11208319B2 | Method for manufacturing a MEMS unit for a micromechanical pressure sensor | Performing Operations; Transporting | 0 | Active |
| US8389327B2 | Method for manufacturing chips | Electricity | 0 | Active |
| US8405210B2 | Method for producing a plurality of chips and a chip produced accordingly | Performing Operations; Transporting | 0 | Active |
| US8519494B2 | Method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate | Performing Operations; Transporting | 0 | Active |
| US10950455B2 | Method for manufacturing a semiconductor device and semiconductor device | Electricity | 0 | Active |
| US9475693B2 | ASIC element, in particular as a component of a vertically integrated hybrid component | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.