Methods, systems, and computer program product for characterizing an electronic design with a schematic driven extracted view
US10997333B1 · kind B1 · utility
1Cited by
64References
20Claims
0Family size
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Key dates
| Filing date | Dec 5, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Dec 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are methods, systems, and articles of manufacture for characterizing an electronic design with a schematic driven extracted view. These techniques identify a schematic of an electronic design, wherein the schematic exists in one or more design fabrics. These techniques further determine an extracted model for characterizing a behavior of the electronic design based at least in part upon the schematic, determine a hierarchical level in a design fabric of the one or more design fabrics of the schematic, and characterize the electronic design with at least an extracted view.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.