Detecting unreliable bits in transistor circuitry
US10999083B2 · kind B2 · utility
1Cited by
3References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Nov 20, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for detecting unreliable bits in transistor circuitry includes applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, the variation being a tilt or bias in a positive or negative direction. An amount of variation in the digital code of the cryptologic element is determined. Unreliable bits in the transistor circuitry are defined as those bits for which the variation is in a range defined as unreliable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.