Yoav Weizman
12Patents
2h-index
22Co-inventors
50Inventor score
Filing activity: Sep 26, 2003 → Nov 20, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9671456B2 | Semiconductor device arrangement, a method of analysing a performance of a functional circuit on a semiconductor device and a device analysis system | Electricity | 4 | Active |
| US10811073B2 | Dynamic memory physical unclonable function | Physics | 2 | Active |
| US11586778B2 | Secured memory | Physics | 2 | Active |
| US10630493B2 | Physical unclonable functions related to inverter trip points | Electricity | 1 | Active |
| US10999083B2 | Detecting unreliable bits in transistor circuitry | Electricity | 1 | Active |
| US7151387B2 | Analysis module, integrated circuit, system and method for testing an integrated circuit | Physics | 1 | Expired |
| US8134384B2 | Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilities | Physics | 1 | Active |
| US8368383B2 | Method for testing a variable digital delay line and a device having variable digital delay line testing capabilities | Physics | 1 | Active |
| US8070357B2 | Device and method for evaluating a temperature | Physics | 0 | Active |
| US9606064B2 | Method of detecting irregular current flow in an integrated circuit device and apparatus therefor | Physics | 0 | Active |
| US8430562B2 | Device and method for evaluating a temperature | Physics | 0 | Active |
| US11321460B2 | Information redistribution to reduce side channel leakage | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.