Generic high-dimensional importance sampling methodology
US11003737B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Sep 5, 2017 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Apr 7, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31718
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of circuit yield analysis for evaluating rare failure events includes performing initial sampling to detect failed samples respectively located at one or more failure regions in a multi-dimensional parametric space, generating a distribution of failed samples at discrete values along each dimension, identifying the failed samples, performing a transform to project the failed samples into all dimensions in a transform space, and classifying a type of failure region for each dimension in the parametric space.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.