Automatic analyzer
US11009515B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2017 |
| Grant date | May 18, 2021 |
| Priority date | — |
| Expiry date | Dec 26, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/1034
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic analyzer capable of controlling an interval between the tip of a sample nozzle and the bottom of a reaction container regardless of individual differences between reaction containers and sample nozzles and suppressing adhesion of a sample to the sample nozzle is disclosed. Sample nozzles 13a and 14a are moved toward the bottom surface of a reaction container 2, the movement of the sample nozzles is stopped at a point in time when a stop position detector 46 detects a stop position detection plate 45, the sample nozzles are ascended from the stop position to a position where the stop position detection plate 45 separates from a detection range of the stop position detector 46, and an arm 44 is moved upward by a moving distance stored in a memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.