Patent · US Active

Fast industrial computed tomography for large objects

US11016042B2 · kind B2 · utility

0Cited by

7References

19Claims

0Family size

Assignee

GE Sensing & Inspection Technologies GmbH · DE

Inventors

Eberhard Neuser · Wunstorf, DE
Alex Sawatzky · Hürth, DE
Nils Rothe · Hürth, DE
Alexander Suppes · Garbsen, DE

Key dates

Filing date	Aug 13, 2019
Grant date	May 25, 2021
Priority date	—
Expiry date	Aug 13, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/3306
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems and methods for non-destructive testing by computed tomography are provided. The system can include a stationary radiation source, a stage, and a plurality of stationary radiation detectors. The source can be configured to emit, from a focal point, a beam of penetrating radiation having a three-dimensional geometry and to direct the beam in a path incident upon a target. The stationary radiation source can be positioned with respect to the plurality of stationary radiation detectors and the stage such that, a first plurality of beam segment paths is defined between the focal point and respective sensing faces of the plurality of radiation detectors and at least one second beam segment path is defined between the focal point and a predetermined gap.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.