Eberhard Neuser
13Patents
3h-index
14Co-inventors
53Inventor score
Filing activity: Feb 22, 2010 → Aug 3, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8744048B2 | Integrated X-ray source having a multilayer total internal reflection optic device | Electricity | 29 | Active |
| US8208602B2 | High flux photon beams using optic devices | Physics | 27 | Active |
| US9146327B2 | Method for determining geometric imaging properties of a flat panel detector, correspondingly adapted X-ray inspection system and calibration phantom | Physics | 5 | Active |
| US9153408B2 | Microfocus X-ray tube for a high-resolution X-ray apparatus | Electricity | 1 | Active |
| US8977022B2 | Computed tomography method, and system | Physics | 1 | Active |
| US8526570B2 | Computed tomography method, computer software, computing device and computed tomography system for determining a volumetric representation of a sample | Physics | 1 | Active |
| US10194874B2 | Computed tomography method, computer software, computing device and computed tomography system for determining a volumetric representation of a sample | Physics | 1 | Active |
| US11585767B2 | Fast industrial, computed tomography for large objects | Physics | 0 | Active |
| US12385857B2 | Rapid high-resolution computerized tomography | Physics | 0 | Active |
| US8861827B2 | System and method for determining confidence measurements of single volume elements in computer tomography | Physics | 0 | Active |
| US11016042B2 | Fast industrial computed tomography for large objects | Physics | 0 | Active |
| US9601300B2 | Cathode element for a microfocus x-ray tube | Electricity | 0 | Active |
| US8515149B2 | Inspection system and method for determining three dimensional model of an object | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.