Temperature-corrected control data for verifying of structural integrity of materials
US11016047B2 · kind B2 · utility
3Cited by
19References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 24, 2018 |
| Grant date | May 25, 2021 |
| Priority date | — |
| Expiry date | Aug 24, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/4099
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure describes techniques for detecting a crack or defect in a material. A computing device may determine whether a tested material includes a crack or other defect based on a temperature-scaled control data set and a measurement data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.