Patent · US Active

Etching using an electrolyzed chloride solution

US11031253B2 · kind B2 · utility

0Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2019
Grant dateJun 8, 2021
Priority date
Expiry dateFeb 13, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31111
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for etching one or more entities on a semiconductor structure, each entity being made of a material selected from metals and metal nitrides is provided. The method includes the steps of: (a) oxidizing by electrolysis, at a current of at least 0.1 A, a precursor solution comprising chloride anions at a concentration ranging from 0.01 mol/l to 1.0 mol/l, thereby forming an etching solution; (b) providing a semiconductor structure having the one or more entities thereon; and (c) etching at least partially the one or more entities by contacting them with the etching solution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.