Inter-domain power element testing using scan
US11047909B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 21, 2019 |
| Grant date | Jun 29, 2021 |
| Priority date | — |
| Expiry date | Jul 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318555
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods, and circuitries are disclosed to test an inter-domain device that is positioned in a signal path between a first output wrapper device in a first module and a first input wrapper device in a second module. In one example, a testing system includes an output scan chain that includes the first output wrapper device and an input scan chain that includes the first input wrapper device. A controller is configured to: provide an output scan enable signal to the output scan chain to cause test data to be stored in the first output wrapper device; capture, with the first input wrapper device, inter-domain device data output; provide an input scan enable signal to the input scan chain to cause the inter-domain device data to be output by an output scan chain serial output; and determine whether the inter-domain device data indicates that the inter-domain device is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.