Himanshu Kukreja
6Patents
2h-index
6Co-inventors
36Inventor score
Filing activity: Jul 27, 2011 → Feb 21, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8689068B2 | Low leakage current operation of integrated circuit using scan chain | Physics | 6 | Active |
| US8832510B2 | Circuit to reduce peak power during transition fault testing of integrated circuit | Physics | 2 | Active |
| US10120026B2 | On-chip test pattern generation | Physics | 1 | Active |
| US10032723B2 | Metal layer independent version identifier | Electricity | 1 | Active |
| US11047909B2 | Inter-domain power element testing using scan | Physics | 1 | Active |
| US8504886B2 | Method for partitioning scan chain | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.