Patent · US Active

Sample transport device with integrated metrology

US11056366B2 · kind B2 · utility

0Cited by
1References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 20, 2019
Grant dateJul 6, 2021
Priority date
Expiry dateFeb 20, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/213
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A metrology system may include one or more casings that fit within an interior cavity of a sample transport device, an illumination source within one of the one or more casings, one or more illumination optics within one of the one or more casings for directing illumination from the illumination source to a sample located in the interior cavity of the sample transport device, one or more collection optics within one of the one or more casings for light from the sample in response to the illumination from the illumination source, and one or more detectors within one of the one or more casings for generating metrology data based on at least a portion of the light collected by the one or more collection optics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.