Time-interleaved analog-to-digital converter with calibration
US11057044B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | May 18, 2020 |
| Grant date | Jul 6, 2021 |
| Priority date | — |
| Expiry date | May 18, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/168
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.