Patent · US Active

Microscope and method for microscopic imaging of an object

US11061216B2 · kind B2 · utility

0Cited by

5References

16Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Michael Goegler · Wolfratshausen, DE
Thomas Ohrt · Golmsdorf, DE
Markus Sticker · Jena, DE

Key dates

Filing date	Mar 14, 2018
Grant date	Jul 13, 2021
Priority date	—
Expiry date	Mar 14, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/0025
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A microscope for imaging an object, comprising a lens assembly, which defines an optical axis and a focal plane perpendicular thereto, and correction optics, which are adjustable for adjustment to a depth position and which correct a spherical aberration on the lens assembly which occurs during imaging of the object at a specific depth position of the focal plane. The microscope may be used to determine a phase difference of radiation from a first lateral region and a second lateral region of the object, and to use a previously known connection between the phase difference and a modification of the spherical aberration caused thereby in order to determine an adjustment value of the correction optics, such that the spherical aberration is reduced when imaging the second region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.