Automated test equipment for testing high-power electronic components
US11067629B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 3, 2019 |
| Grant date | Jul 20, 2021 |
| Priority date | — |
| Expiry date | Aug 11, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2608
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the present application are directed to an automated test equipment (ATE) and methods for operating the same for testing high-power electronic components. The inventor has recognized and appreciated an ATE that provides both high-power alternating-current (AC) and direct-current (DC) testing in a single test system can lead to high throughput testing for high-power components with reduced system hardware complexity and cost. Aspects of the present application provide a synchronized inductor switch module and both a high-precision digitizer and a high-speed digitizer for capturing DC and AC characteristics of a high-power transistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.