Jack E. Weimer
7Patents
3h-index
6Co-inventors
46Inventor score
Filing activity: Jan 15, 2002 → Jun 3, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6759842B2 | Interface adapter for automatic test systems | Physics | 8 | Expired |
| US10698020B2 | Current regulation for accurate and low-cost voltage measurements at the wafer level | Physics | 3 | Active |
| US7561083B2 | Testing of analog to digital converters | Electricity | 3 | Active |
| US6697753B2 | Methods and apparatus for testing electronic devices | Physics | 3 | Expired |
| US9989584B2 | Controlling signal path inductance in automatic test equipment | Physics | 1 | Active |
| US11041900B2 | Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level | Physics | 0 | Active |
| US11067629B2 | Automated test equipment for testing high-power electronic components | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.