Patent · US Active

Automatic part testing

US11068368B2 · kind B2 · utility

0Cited by

4References

17Claims

0Family size

Assignee

Advanced Micro Devices, Inc. · US

Inventors

Amitabh Mehra · Fort Collins, US
Anil Harwani · Austin, US
William Robert Alverson · Campo Alto, US
Grant Evan Ley · Eden, US
Jerry Anton Ahrens · Austin, US
Mustansir M. Pratapgarhwala · Austin, US
Scott E. Swanstrom · Austin, US

Key dates

Filing date	Dec 16, 2019
Grant date	Jul 20, 2021
Priority date	—
Expiry date	Dec 16, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3692
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.