Patent · US Active

Manufacturing method of self-aligned DMOS body pickup

US11069777B1 · kind B1 · utility

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9References
18Claims
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Key dates

Filing dateJun 9, 2020
Grant dateJul 20, 2021
Priority date
Expiry dateJun 9, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0289

Abstract

A manufacturing process of a DMOS device in a drift region in a semiconductor substrate, having: forming a polysilicon layer above the drift region; forming a block layer above the polysilicon layer; etching both the block layer and the polysilicon layer, through a window of a first masking layer to expose a window to the drift region; implanting dopants through the window to the drift region to form a body region; forming blocking spacers to wrap side walls of the polysilicon layer; implanting dopants into the body region under a window shaped by the blocking spacers to form a body pickup region; etching away the blocking spacers; performing a masking step to form gates; forming ONO spacers to wrap side walls of the gates; and performing a masking step to form source regions and drain pickup regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.