Method for detecting a defect in an LED string and electronic circuit with at least one LED string
US11076473B2 · kind B2 · utility
0Cited by
1References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2019 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | Nov 26, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05B45/58
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and an electronic circuit are disclosed. The method includes detecting at least one operating parameter in an electronic circuit that includes a monitored LED string; adjusting a voltage threshold based on the at least one detected operating parameter; detecting a string voltage across the monitored LED string; comparing the string voltage with the voltage threshold; and detecting a defect in the LED string based on the comparing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.