Analyzer sample detection method and system
US11079333B2 · kind B2 · utility
1Cited by
21References
23Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 24, 2020 |
| Grant date | Aug 3, 2021 |
| Priority date | — |
| Expiry date | Mar 24, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0833
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle. A camera receives light from the illumination source reflected off the sample for detecting the presence of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.