Patent assignee · US · COMPANY

SCIAPS, INC.

27Patents
27Active
27Granted
51Portfolio score

Filing activity: Jul 17, 2012 → Jan 18, 2023

Most-cited patents

PatentTitleAreaCited byStatus
US9267842B2 Automated focusing, cleaning, and multiple location sampling spectrometer system Physics 9 Active
US9036146B2 Micro purge of plasma region Physics 9 Active
USD763108S1 Handheld laser induced breakdown spectroscopy analyzer General 8 Active
US9360367B2 Handheld LIBS spectrometer Physics 6 Active
US9243956B2 Automated multiple location sampling analysis system Electricity 6 Active
US9435742B2 Automated plasma cleaning system Physics 4 Active
US9939383B2 Analyzer alignment, sample detection, localization, and focusing method and system Physics 4 Active
US9395243B2 Handheld LIBS analyzer end plate purging structure Electricity 3 Active
US9714864B2 LIBS analysis system Physics 3 Active
USD763110S1 Handheld laser induced breakdown spectroscopy analyzer nose plate General 3 Active
US9952100B2 Handheld LIBS spectrometer Physics 3 Active
US9285272B2 Dual source system and method Physics 2 Active
US9651424B2 LIBS analyzer sample presence detection system and method Physics 2 Active
US11169100B2 Portable, hand held aluminum alloy XRF analyzer and method Physics 2 Active
US9970876B2 Dual source analyzer with single detector Physics 2 Active
US9182278B2 Wide spectral range spectrometer Physics 2 Active
US9719853B2 LIBS analysis system Physics 2 Active
US10209196B2 LIBS analysis system and method for liquids Physics 2 Active
US9568430B2 Automated focusing, cleaning, and multiple location sampling spectrometer system Physics 1 Active
US11079333B2 Analyzer sample detection method and system Physics 1 Active
US9970815B2 LiBS analyzer sample presence detection system and method Physics 1 Active
US10012603B2 Combined handheld XRF and OES systems and methods Physics 1 Active
US9874475B2 Automated multiple location sampling analysis system Electricity 0 Active
USD1053354S1 Handheld X-ray fluorescence instrument General 0 Active
US9664565B2 LIBS analyzer sample presence detection system and method Physics 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.