Method, apparatus and computer program product for determining failure regions of an electrical device
US11093851B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 18, 2013 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Mar 2, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/088
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One or more failure regions are determined for an electrical device by training a machine learning classifier, including analyzing data points for the device and recognizing patterns in the data points. Each data point indicates pass or fail of the device for a particular combination of factors relating to the operation of the device. The trained machine learning classifier is used to predict the pass/fail state of new data points for the electrical device. Each new data point corresponds to a new combination of the factors relating to the operation of the device not previously analyzed by the machine learning classifier. A pass/fail border region can be identified for the electrical device based on the training of the machine learning classifier, the pass/fail border region excluding data points for which the electrical device is expected to pass or fail with a high degree of certainty.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.