Verifying structural integrity of materials using reference impedance
US11105762B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2017 |
| Grant date | Aug 31, 2021 |
| Priority date | — |
| Expiry date | May 25, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/1263
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.