Resolution enhancement for line scanning excitation microscopy systems and methods
US11106027B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Apr 1, 2019 |
| Grant date | Aug 31, 2021 |
| Priority date | — |
| Expiry date | Aug 30, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/58
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.