Patent · US Active

Resolution enhancement for line scanning excitation microscopy systems and methods

US11106027B2 · kind B2 · utility

0Cited by
5References
20Claims
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Key dates

Filing dateApr 1, 2019
Grant dateAug 31, 2021
Priority date
Expiry dateAug 30, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/58
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.