Negative path testing in a bootloader environment
US11138084B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Nov 21, 2019 |
| Grant date | Oct 5, 2021 |
| Priority date | — |
| Expiry date | Nov 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3065
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Negative path testing in a bootloader environment can include backing up a global state of a component under test, injecting a fault to trigger an error in the component under test in a bootloader environment, executing error handling instructions until a checkpoint of the component under test in the bootloader environment is reached, restoring the global state to the component under test from the backup, and restarting the component under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.