Testing one-time programmable (OTP) memory with data input capture through sense amplifier circuit
US11152038B2 · kind B2 · utility
2Cited by
2References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2020 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Feb 17, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/063
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Certain aspects of the present disclosure provide methods and apparatus for testing a one-time programmable (OTP) memory device, including the functionality of a sense amplifier circuit. The OTP memory device includes a memory array, an input latch circuit, and a sense amplifier circuit comprising a current source and a multiplexer. The multiplexer has a first input coupled to an output of the memory array, a second input coupled to the input latch circuit, and an output coupled to an input of the current source circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.