Electrical test probes having decoupled electrical and mechanical design
US11156637B2 · kind B2 · utility
2Cited by
10References
15Claims
0Family size
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Key dates
| Filing date | Jun 13, 2019 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | Jun 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores. An important application of this approach is to provide impedance matched transmission line probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.